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Title: Process-Induced Variation Analysis of Ferroelectric Transistors and Its Machine Learning-Assisted Approach
Committee:
Dr. Yu, Advisor
Dr. Khan, Chair
Dr. Naeemi
Abstract: The objective of the proposed research is to study FeFET which is one of the promising memory devices. To expect the future of FeFET and to prepare for the problems it might face, variation analysis of FeFET is investigated under several structures. In addition, machine learning assisted approach is proposed to reduce simulation time consumption and to predict its statistics with high precision.
