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Title: Reliability and Data Analysis of Wearout Mechanisms for Ring Oscillator Circuits
Committee:
Dr. Milor, Advisor
Dr. Klein, Chair
Dr. Davenport
Abstract:
The objective of the proposed research is to investigate the wearout mechanisms for ring oscillator circuits, as well as to develop data analysis techniques for failure data. Failure analysis is generally done using test structures, but these only isolate a certain type of failure mode. Circuits have confounded wearout modes but are difficult to analyze. Thus, ring oscillators may be a feasible alternative due to their simple structure. The methodology for analyzing the confounded data in ring oscillators will be discussed, and parameter effects on the accelerated testing regions will be explored.
