Testing silicon-germanium devices

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Testing silicon-germanium devices

Georgia Tech Professor John Cressler and student researcher Eleazar Kenyon (l-r) examine a functional prototype developed for NASA using silicon-germanium microchips. (Photo: Gary Meek)

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  • Created By: John Toon
  • Workflow Status: Published
  • Created On: Dec 3, 2015 - 4:00pm
  • Last Updated: Oct 7, 2016 - 10:42pm