Technical Seminar on Atom Probe Tomography for 3D Atomic- Scale Characterization and Biomaterials Analysis

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Event Details
  • Date/Time:
    • Wednesday September 11, 2019 - Thursday September 12, 2019
      12:00 pm - 12:59 pm
  • Location: Pettit Microelectronics Building 102A | 791 Atlantic Drive | Atlanta GA | 30332
  • Phone:
  • URL:
  • Email:
  • Fee(s):
    N/A
  • Extras:
    Free food
Contact
Eric Woods - EM Support & Consulting; SEM, TEM, FIB
Summaries

Summary Sentence: This talk will cover APT operational theory, an introduction to sample prep and data reconstruction, and an overview of various applications.

Full Summary: No summary paragraph submitted.

Related Files

Abstract: Atom Probe Tomography (APT) is the highest special resolution analytical characterization technique with high efficiency single atom detection for quantitative atom scale 3D compositional analysis and elemental mapping of chemical heterogeneities. This talk will cover APT operational theory, an introduction to sample prep and data reconstruction, and an overview of various applications. A commercial cryo-UHV solution for FIB-APT specimen transfer will also be presented which expands the application space for APT tobiological materials, hydrogen containing materials, and surfaces prone to rapid oxidation.

Bio: Robert M. Ulfig has played many roles at CAMECA (Imago) since 2001 and now works as a Product Manager for the atom probe products. Robert previously worked as a Sr. Process Engineer at Advanced Micro Devices sub-micron development center in Sunnyvale CA, and graduated from The University of Wisconsin-Madison with a BS in Nuclear Engineering (Reactor Operator at the department’s 1MWt nuclear reactor) and a Masters in Materials Science and Engineering.

Lunch Provided with Registration

https://tinyurl.com/CamekaAPT

Additional Information

In Campus Calendar
Yes
Groups

3D Systems Packaging Research Center, Georgia Electronic Design Center (GEDC), Institute for Electronics and Nanotechnology, NanoTECH, The Center for MEMS and Microsystems Technologies

Invited Audience
Faculty/Staff, Postdoc, Public, Graduate students, Undergraduate students
Categories
Career/Professional development, Seminar/Lecture/Colloquium
Keywords
Nanotechnology, Institute for Electronics and Nanotechnology, Institute for Materials (IMat), Materials Characterization Facility, advanced materials, biomaterials analysis, Atom probe tomography
Status
  • Created By: Christa Ernst
  • Workflow Status: Published
  • Created On: Aug 27, 2019 - 10:38am
  • Last Updated: Aug 27, 2019 - 10:38am