Atomic Force Microscope Analysis

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Atomic Force Microscope Analysis

Georgia Tech Ph.D. Candidate Lee Griffin places the single crystal sample onto the measurement stage of the modified atomic force microscope (i.e. piezoresponse force microscope). (Photo: Rob Felt, Georgia Tech)

Additional Information

Groups

Georgia Tech Materials Institute, Research Horizons

Categories
Research, Computer Science/Information Technology and Security, Physics and Physical Sciences
Keywords
atomic force microscope, materials, ferroelectric, machine learning
Status
  • Created By: John Toon
  • Workflow Status: Published
  • Created On: Aug 15, 2019 - 8:18pm
  • Last Updated: Aug 15, 2019 - 8:18pm