MCF Workshop - Overview to Atomic Force Microscopy

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Event Details
Contact

 Dr. Walter Henderson: walter.henderson@ien.gatech.edu

Summaries

Summary Sentence: This workshop will provide attendees first-hand knowledge on Atomic Force Microscopy (AFM)

Full Summary: No summary paragraph submitted.

Related Files

This workshop will provide attendees first-hand knowledge on Atomic Force Microscopy (AFM). Topic that will be covered include:

  •     Theoretical basis of Atomic Force Microscopy
  •     Important considerations when choosing an AFM instrument
  •     Applications for AFM measurements
  •     Hands-on measurement with model samples

Register at: https://learnaboutafhatgt.eventbrite.com

Contact Dr. Walter Henderson at: walter.henderson@ien.gatech.edu for more information.

Additional Information

In Campus Calendar
Yes
Groups

3D Systems Packaging Research Center, Georgia Electronic Design Center (GEDC), Institute for Electronics and Nanotechnology, NanoTECH, The Center for MEMS and Microsystems Technologies

Invited Audience
Faculty/Staff, Postdoc, Public, Graduate students, Undergraduate students
Categories
Career/Professional development, Training/Workshop
Keywords
atomic force microscopy, microscopy, The Materials Characteriazation Facility, the Institute for Electronics and Nanotechnology, the School of Materials Science and Egineering, Nanotechnology, Biology, imaging techniques, workshop, cleanroom training
Status
  • Created By: Christa Ernst
  • Workflow Status: Published
  • Created On: Aug 30, 2018 - 11:26am
  • Last Updated: Aug 30, 2018 - 11:26am