Practical Surface Characterization of Materials: An Interactive Short Course on XPS, UPS and SIMS: Principles, Practice, Instrumentation and Hands-on Data Analysis

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Event Details
  • Dates/Times:
    • Monday October 8, 2018 - Tuesday October 9, 2018
      9:00 am - 4:59 pm
    • Tuesday October 9, 2018 - Wednesday October 10, 2018
      9:00 am - 4:59 pm
  • Location: Marcus Nanotechnology Building | 345 Ferst Drive | Atlanta GA | 30332
  • Phone: (404)894-5100
  • URL: The Institute for Electronics and Nanotechnology
  • Email: info@ien.gatech.edu
  • Fee(s):
    Varies
  • Extras:
    Free food
Contact

Yolande Berta - Sr. Research Scientist, Materials Characterization Facility (MCF)
Georgia Tech Materials Characterization Facility
404.894.2545
yb4@mail.gatech.edu

Summaries

Summary Sentence: A detailed introduction to the principles and practice of two techniques for analyzing the first few monolayers of a surface: XPS -the most common surface analytical method and ToF-SIMS a mass-spectroscopy-based method complementary in many ways to XPS.

Full Summary: Attendance is open to the general technical community and is not limited to current Georgia Tech students or IEN users. The course will be of value to anyone needing to analyze the physical-chemical properties of surfaces including catalysts; thin-film metals and semiconductors; low-dimensional materials such as graphene, CNT's, and MoS2; polymers for food packaging or medical implants; corrosion studies in metals; among other materials. The course should prove useful to everyone from the interested novice, unfamiliar with these techniques - but with a practical need for information about the surface composition/chemistry of a sample - up to those with even a moderately advanced practical XPS or SIMS background looking to develop a deeper understanding.

A detailed introduction to the principles and practice of two techniques for analyzing the first few monolayers of a surface: XPS -the most common surface analytical method and ToF-SIMS a mass-spectroscopy-based method complementary in many ways to XPS.  Taken together they allow:

  • The detection of the elemental composition of a sample
  • The detection of even trace elements down to ppm of a monolayer
  • The chemical bonding between elements
  • The lateral and vertical distribution of elements in the top layers of a sample
  • The surface bonding and band structure of compounds including work function and band occupancy

Target Audience:

Attendance is open to the general technical community and is not limited to current Georgia Tech students or IEN users. The course will be of value to anyone needing to analyze the physical-chemical properties of surfaces including catalysts; thin-film metals and semiconductors; low-dimensional materials such as graphene, CNT's, and MoS2; polymers for food packaging or medical implants; corrosion studies in metals; among other materials. The course should prove useful to everyone from the interested novice, unfamiliar with these techniques - but with a practical need for information about the surface composition/chemistry of a sample - up to those with even a moderately advanced practical XPS or SIMS background looking to develop a deeper understanding.

Rates: *Rates include lunches on all days*

  • Georgia Tech Rate: $150
  • Academic and Government Rate: $250
  • Industry Rate: $500

Registration: Due to the nature of the lab portion of the course, registration has a maximum of 40 participants. Your registration is not guaranteed until full payment is received. If you wish to charge the course to an IEN Cleanroom account, please contact us immediately so that we can provide the proper forms, and so that we may notify the PI or accounts representative. Credit cards are the only payment option for people outside Georgia Tech. Once you submit your registration, follow the appropriate links in your confirmation email. A waiting list of overflow registrants will be maintained in case of cancellations.

 Registration Available Here

 

Additional Information

In Campus Calendar
Yes
Groups

3D Systems Packaging Research Center, Georgia Electronic Design Center (GEDC), Institute for Electronics and Nanotechnology, NanoTECH, The Center for MEMS and Microsystems Technologies

Invited Audience
Faculty/Staff, Postdoc, Public
Categories
Career/Professional development, Training/Workshop
Keywords
Materials Characterization Facility, the Institute for Electronics and Nanotechnology, The School of Materials Science and Engineering, the School of Electrical and Computer Engineering, nanomaterials, XPS, SIMS, Characterization techniques, lab training
Status
  • Created By: Christa Ernst
  • Workflow Status: Published
  • Created On: Aug 22, 2018 - 9:54am
  • Last Updated: Aug 22, 2018 - 9:54am