C3PS Upcoming Lecture: Adaptive and Resilient Circuits for Dynamic Variation Tolerance in SoC and Emerging IoT Systems

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Event Details
Contact

arijit.raychowdhury@ece.gatech.edu

Summaries

Summary Sentence: This presentation describes adaptive and resilient circuits to mitigate the adverse effects from dynamic parameter variations, resulting in higher processor performance, energy efficiency, and yield, while highlighting the key design trade-offs.

Full Summary: No summary paragraph submitted.

C3PS Upcoming Lecture: Adaptive and Resilient Circuits for Dynamic Variation Tolerance in SoC and Emerging IoT Systems

Dr. Keith Bowman; Processor Research Team, Qualcomm Inc.

Abstract: System-on-chip (SoC) processors across all market segments, ranging from small IoT devices to large multicore servers, experience dynamic device and circuit parameter variations during the operational lifetime such as supply voltage droops, temperature changes, and transistor aging. These dynamic parameter variations degrade processor performance, energy efficiency, and yield. For future IoT edge processors, the low-cost packaging, voltage regulation with timevarying energy harvesters, wide range of temperature conditions, and long-lifetime requirements exacerbate these problems. This presentation describes adaptive and resilient circuits to mitigate the adverse effects from dynamic parameter variations, resulting in higher processor performance, energy efficiency, and yield, while highlighting the key design trade-offs and testing implications for product deployment.

Biography: Keith A. Bowman is a Principal Engineer and Manager in the Processor Research Team at Qualcomm Technologies, Inc. in Raleigh, NC. He is responsible for researching and developing circuit technologies for enhancing the performance and energy efficiency of Qualcomm processors. He pioneered the invention, design, and test of Qualcomm’s first commercially successful circuit for mitigating the adverse effects of supply voltage droops. He received the B.S. degree from North Carolina State University and the M.S. and Ph.D. degrees from the Georgia Institute of Technology, all in electrical engineering. He previously worked in the Technology-CAD Group and the Circuit Research Lab at Intel Corporation in Hillsboro, OR. Dr. Bowman has published over 75 technical papers in refereed conferences and journals, authored one book chapter, received 10 patents with 10 more inventions filed, and presented over 30 tutorials on variation-tolerant circuit designs. He received the 2016 Qualcomm Corporate Research and Development (CRD) Distinguished Contributor Award for Technical Contributions, representing CRD’s highest recognition. He previously chaired the ISQED and ICICDT conferences and currently serves on the ISSCC technical program committee.

Additional Information

In Campus Calendar
Yes
Groups

3D Systems Packaging Research Center, Georgia Electronic Design Center (GEDC), Institute for Electronics and Nanotechnology, NanoTECH, The Center for MEMS and Microsystems Technologies

Invited Audience
Faculty/Staff, Public, Graduate students, Undergraduate students
Categories
Seminar/Lecture/Colloquium
Keywords
system-on-chip, IoT, the Institute for Electronics and Nanotechnology, flexible electronics, hybrid electronics, energy harvesting, energy storage, Internet of Things, bioengineering, sensors, mems, flexible circuits, School of Mechanical Engineering, School of Electrical and Computer Engineering, additive manufacturing, High-end processors, many-core processors
Status
  • Created By: Christa Ernst
  • Workflow Status: Published
  • Created On: Oct 24, 2017 - 2:07pm
  • Last Updated: Oct 24, 2017 - 2:07pm