Atom Probe Tomography: Applications and Techniques

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Event Details
  • Date/Time:
    • Tuesday August 15, 2017
      11:45 am - 1:15 pm
  • Location: Marcus Nanotechnology Building | 345 Ferst Drive | Atlanta GA | 30332
  • Phone: (404) 894-5100
  • URL: IEN
  • Email: info@ien.gatech.edu
  • Fee(s):
    N/A
  • Extras:
    Free food
Contact

Eric Woods - Georgia Tech: Institute for Electronics and Nanotechnology & Materials Characterization Facility
eric,woods@ien.gatech.edu
404.385.2877

 

Summaries

Summary Sentence: Learn more about this technique and how it may be applied to your research at this event.

Full Summary: No summary paragraph submitted.

Related Files

Atom Probe Tomography (APT) is the highest spatial resolution analytical characterization technique with high efficiency single atom detection for quantitative atomic scale 3D elemental mapping of chemical heterogeneities. Learn more about this technique and how it may be applied to your research at this event.

Agenda Topics:

Atom Probe Tomography (APT): Operational Theory
Introduction to APT Data Reduction
Introduction to APT Sample Preparation
APT Applications

  • Metals: Integration with Advanced Modeling
  • Ceramics, high performance materials
  • Semiconductor Devices: Planar and finFET, LED Devices, III/V
  • Geological Materials and Biominerals

Correlative synergy

  • t-EBSD
  • TEM
  • EPMA

Atom Probe Tomography Instrumentation

Lunch will be provided.

Attendance is free of charge but space is limited!
To register, please complete the registration form by August 8th 2017
Register Here

Additional Information

In Campus Calendar
Yes
Groups

Institute for Electronics and Nanotechnology

Invited Audience
Faculty/Staff, Public, Graduate students, Undergraduate students
Categories
Career/Professional development, Seminar/Lecture/Colloquium, Training/Workshop
Keywords
Tomography, Atom probe tomography, Characterization techniques, microscopy, materials science, Nanotechnology, thin films, materials defects, metals, ceramics, Advanced Semiconductor Manufacturing, defect inspection, the Institute for Electronics and Nanotechnology, the institute for materials, The School of Materials Science and Engineering, The School of Mechanical Engineering, the School of Electrical and Computer Engineering
Status
  • Created By: Christa Ernst
  • Workflow Status: Published
  • Created On: Jul 27, 2017 - 11:31am
  • Last Updated: Jul 27, 2017 - 12:36pm