Atom Probe Tomography: Applications and Techniques

*********************************
There is now a CONTENT FREEZE for Mercury while we switch to a new platform. It began on Friday, March 10 at 6pm and will end on Wednesday, March 15 at noon. No new content can be created during this time, but all material in the system as of the beginning of the freeze will be migrated to the new platform, including users and groups. Functionally the new site is identical to the old one. webteam@gatech.edu
*********************************

Event Details
  • Date/Time:
    • Tuesday August 15, 2017
      11:45 am - 1:15 pm
  • Location: Marcus Nanotechnolgy Conference Room 1117 | 345 Ferst Drive | Atlanta GA | 30332
  • Phone: (404)894-5100
  • URL: IEN
  • Email: info@ien.gatech.edu
  • Fee(s):
    N/A
  • Extras:
    Free food
Contact

Eric Woods - Georgia Tech: Institute for Electronics and Nanotechnology & Materials Characterization Facility

Summaries

Summary Sentence: Learn more about this technique and how it may be applied to your research at this event. visualizing

Full Summary: No summary paragraph submitted.

Related Files

Atom Probe Tomography (APT) is the highest spatial resolution analytical characterization technique with high efficiency single atom detection for quantitative atomic scale 3D elemental mapping of chemical heterogeneities. Learn more about this technique and how it may be applied to your research at this event.

Agenda Topics:
Atom Probe Tomography (APT): Operational Theory
Introduction to APT Data Reduction
Introduction to APT Sample Preparation
APT Applications

  • Metals: Integration with Advanced Modeling
  • Ceramics, high performance materials
  • Semiconductor Devices: Planar and finFET, LED Devices, III/V
  • Geological Materials and Biominerals

Correlative synergy

  • t-EBSD
  • TEM
  • EPMA

Atom Probe Tomography Instrumentation

Lunch will be provided.
Register at: ien.gatech.edu/prof-dev
Attendance is free of charge but space is limited!
To register, please complete the registration form by August 8th 2017

Additional Information

In Campus Calendar
No
Groups

3D Systems Packaging Research Center, Georgia Electronic Design Center (GEDC), Institute for Electronics and Nanotechnology, NanoTECH, The Center for MEMS and Microsystems Technologies

Invited Audience
Faculty/Staff, Public, Graduate students, Undergraduate students
Categories
Career/Professional development, Seminar/Lecture/Colloquium, Training/Workshop
Keywords
Atom probe tomography, Materials Characterization Facility, Nanotechnology, Institute for Electronics and Nanotechnology, Institute for Materials, microscopy techniques, analytical characterization, School of Materials Science and Engineeering, Electrical and Computer Engineering, thin films, Advanced Semiconductor Manufacturing, 3D chemical mapping
Status
  • Created By: Christa Ernst
  • Workflow Status: Published
  • Created On: Jul 12, 2017 - 4:09pm
  • Last Updated: Jul 12, 2017 - 4:09pm