Materials Characterization Short Course: Surface Science Techniques – Focus on Photoelectron Spectroscopy and ToF-SIMS

*********************************
There is now a CONTENT FREEZE for Mercury while we switch to a new platform. It began on Friday, March 10 at 6pm and will end on Wednesday, March 15 at noon. No new content can be created during this time, but all material in the system as of the beginning of the freeze will be migrated to the new platform, including users and groups. Functionally the new site is identical to the old one. webteam@gatech.edu
*********************************

Event Details
  • Dates/Times:
    • Thursday August 17, 2017 - Friday August 18, 2017
      9:00 am - 3:59 pm
    • Friday August 18, 2017 - Saturday August 19, 2017
      9:00 am - 3:59 pm
  • Location: Marcus Nanotechnology Building | 345 Ferst Drive | Atlanta GA | 30332
  • Phone: (404) 894-5100
  • URL: IEN
  • Email: info@ien.gatech.edu
  • Fee(s):
    Varies
  • Extras:
Contact

Prof. Faisal Alamgir, faisal.alamgir@mse.gatech.edu , or
Walter Henderson, walter.henderson@gatech.edu

Summaries

Summary Sentence: Save the Date for a New Short Course: Surface Science Techniques – Focus on Photoelectron Spectroscopy and ToF-SIMS. Course dates = Aug. 17 & 18. Registration opens July 6th, 2017.

Full Summary: No summary paragraph submitted.

Preliminary Agenda

Day1 – Photoelectron Spectroscopy:
09:00                Introduction and Scope of Short Course – Prof. F. Alamgir
09:15 – 10:00:  Lecture pt. I:  Theoretical background of Photoelectron Spectroscopy
10:05 – 10:30:  Tour of MCF characterization labs
10:35 – 10:45:  Coffee break
10:50 – 11:35:  Lecture pt. II:  Theoretical background of Photoelectron Spectroscopy
12:00 – 13:00:  Lunch break
13:05 – 13:45:  Introduction to XPS analysis software
13:45 – 15:05:  XPS hands-on operation and data analysis sessions. 
15:10 – 16:00:  General comments:  Open question and answer session

Day2 – Time of Flight SIMS:
09:30                Introduction– Prof. F. Alamgir
09:35 – 10:15:  Lecture pt. I:  Theoretical background of SIMS/ ToF-SIMS
10:15 – 10:30:  Tour of IEN microfabrication facility
10:35 – 10:45:  Coffee break
10:50 – 11:30:   Practical concerns for ToF-SIMS and Alternate Surface Science Techniques
11:30 – 13:00:   Lunch break
13:05 – 13:15:   Introduction to ToF-SIMS analysis software
13:15 – 15:15:   ToF-SIMS for hands-on analysis session.
15:20 – 15:55:   Open question and answer session
 

Regsiter Here

Questions? Please contact:
Prof. Faisal Alamgir, faisal.alamgir@mse.gatech.edu , or
Walter Henderson, walter.henderson@gatech.edu

Additional Information

In Campus Calendar
Yes
Groups

Institute for Electronics and Nanotechnology

Invited Audience
Faculty/Staff, Public, Graduate students, Undergraduate students
Categories
Career/Professional development, Seminar/Lecture/Colloquium, Training/Workshop
Keywords
electron microscopy, short course, ToF-SIMS, microscopy techniques, Photoelectron Spectroscopy, the Institute for Electronics and Nanotechnology, the Materials Characterizaton Facility, the Institue for Materials, IMat, The School of Materials Science and Engineering, The School of Mechanical Engineering, the School of Electrical and Computer Engineering, Biomedical Engineering
Status
  • Created By: Christa Ernst
  • Workflow Status: Published
  • Created On: Jun 15, 2017 - 3:12pm
  • Last Updated: Jul 27, 2017 - 12:36pm