*********************************
There is now a CONTENT FREEZE for Mercury while we switch to a new platform. It began on Friday, March 10 at 6pm and will end on Wednesday, March 15 at noon. No new content can be created during this time, but all material in the system as of the beginning of the freeze will be migrated to the new platform, including users and groups. Functionally the new site is identical to the old one. webteam@gatech.edu
*********************************
Title: Comprehensive Variation-aware Aging Simulator using a Unified Gate Delay Model
Committee:
Dr. Linda Milor, ECE, Chair , Advisor
Dr. Sung-Kyu Lim, ECE
Dr. Azad Naeemi, ECE
Dr. Abhijit Chatterjee, ECE
Dr. Jye-Chyi Lu, ISyE
Abstract:
This research developed a framework which analyzes circuit-level reliability and evaluates the lifetimes of complex systems like state-of-art microprocessors. The novelty of the proposed work lies on its statistical timing analyzer and the ability to handle the combined effect of a variety of front-end-of-line (FEOL) wearout mechanisms, while including both the manufacturing process variability and the real-time uncertainties in workload and ambient conditions like operating temperature and IR drops. Overall, the proposed framework presents the correlation between circuit performance (speed) and circuit lifetime, which enables circuit designers to avoid excessive guard-banding, by using a better understood reliability budget to achieve higher performance.