IEN Imaging Seminar: 3D X-Ray Microscopy XRM and FIB-SEM: Recent Advances and Results in Materials Research and the Life Sciences

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Event Details
  • Date/Time:
    • Wednesday October 26, 2016 - Thursday October 27, 2016
      10:00 am - 12:59 pm
  • Location: Marcus Nanotechnology, Room 1117-1118, 345 Ferst Drive, Atlanta GA 30332
  • Phone:
  • URL: Institute for Electronics and Nanotechnology
  • Email:
  • Fee(s):
    N/A
  • Extras:
Contact

Eric Woods

Summaries

Summary Sentence: Join IEN as they present an overview of XRM and FIB-SEM technology as well as prominent examples and applications, including correlative workflows.

Full Summary: No summary paragraph submitted.

Join us for a technical seminar on recent advances in instrumentation and methods that have opened the door for a variety of new opportunities in 3D characterization and visualization. Specifically, ZEISS X-Ray microscopes (XRM) have uniquely incorporated synchrotron-influenced optical and detection systems to push the boundaries of laboratory XRM, enabling flexible three dimensional imaging capabilities for a wide variety of applications. Similarly, improvements in FIB-SEM instrumentation have enabled new, high resolution applications spanning from nano-patterning and fabrication to 3D imaging and chemical analysis. This talk will cover an overview of XRM and FIB-SEM technology as well as prominent examples and applications, including correlative workflows.

Register by October the 24th to attend the seminar and receive your lunch at: ien.gatech.edu/iszeiss

Additional Information

In Campus Calendar
No
Groups

Georgia Tech Materials Institute

Invited Audience
Faculty/Staff, Undergraduate students, Graduate students
Categories
Seminar/Lecture/Colloquium
Keywords
No keywords were submitted.
Status
  • Created By: Farlenthia Walker
  • Workflow Status: Published
  • Created On: Oct 14, 2016 - 12:47pm
  • Last Updated: Apr 13, 2017 - 5:14pm