*********************************
There is now a CONTENT FREEZE for Mercury while we switch to a new platform. It began on Friday, March 10 at 6pm and will end on Wednesday, March 15 at noon. No new content can be created during this time, but all material in the system as of the beginning of the freeze will be migrated to the new platform, including users and groups. Functionally the new site is identical to the old one. webteam@gatech.edu
*********************************
Atlanta, GA | Posted: July 7, 2009
Lab Manager - July 7, 2009
A new statistical analysis technique that identifies and removes systematic bias, noise and equipment-based artifacts from experimental data could lead to more precise and reliable measurement of nanomaterials and nanostructures likely to have future industrial applications. "Our statistical model will be useful when the nanomaterials industry scales up from laboratory production because industrial users cannot afford to make a detailed study of every production run," says C. F. Jeff Wu, a professor in the Stewart School of Industrial and Systems Engineering at Georgia Tech. "The significant experimental errors can be filtered out automatically, which means this could be used in a manufacturing environment."
http://www.labmanager.com/news.asp?ID=740
