Introducing the Empyrean Nano Edition

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Event Details
  • Date/Time:
    • Thursday September 1, 2016
      10:00 am - 11:30 am
  • Location: Marcus Nanotechnology Building - Characterization Suite: Level 0 | 345 Ferst Drive | Atlanta GA 30332
  • Phone: (404) 894-5100
  • URL: http://ien.gatech.edu
  • Email: info@ien.gatech.edu
  • Fee(s):
    N/A
  • Extras:
Contact

David Ameer Tavakoli, Materials Characterization Facility PANalytical XRD Facilities Manager

david.tavakoli@mse.gatech.edu

Summaries

Summary Sentence: In this webinar, PANalytical will introduce to you the main features of the Empyrean Nano and demonstrate its unique capabilities by discussing several application examples.

Full Summary: No summary paragraph submitted.

SAXS/WAXS and more: Introducing the Empyrean Nano

This Webinar will be displayed on the main monitor in the lobby of the Characterization Suite in the Marcus Nanotechnology Building at 10:00AM on September 1st.

The Empyrean Nano edition enables a variety of X-ray scattering techniques that can be applied for the structural characterization of nanomaterials on multiple length scales. The instrument is based on a high-resolution goniometer platform and the proven PreFIX concept, thus offering maximum flexibility. Main applications are SAXS/WAXS, bio-SAXS, USAXS and total scattering (PDF analysis).

More information can be found here.

Additional Information

In Campus Calendar
Yes
Groups

NanoTECH, Institute for Electronics and Nanotechnology, Georgia Electronic Design Center (GEDC), The Center for MEMS and Microsystems Technologies, 3D Systems Packaging Research Center

Invited Audience
Undergraduate students, Faculty/Staff, Public, Graduate students
Categories
Seminar/Lecture/Colloquium, Training/Workshop
Keywords
Empyrean Nano, Imaging and Characterization, materials characterization, Nanotechnology, SAXS/WAXS, the Institute for Electronics and Nanotechnology, the institute for materials, the School of Electrical and Computer Engineering, The School of Materials Science and Engineering, X-ray scattering
Status
  • Created By: Christa Ernst
  • Workflow Status: Draft
  • Created On: Aug 30, 2016 - 7:03am
  • Last Updated: Apr 13, 2017 - 5:14pm