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Title: Frontend Reliability Analysis and Modeling from Device to Integrated Circuits
Committee:
Dr. Milor, Advisor
Dr. Keezer, Chair
Dr. Naeemi
Abstract: The objective of this research is to extract NBTI and GOBD model parameters to enable the estimation of the remaining life of individual chips. For the parameter extraction, the device-level models of both reliability mechanisms are modelled with the RTN model. The ability to predict a lifetime enables the optimization of timing guardbands or circuit adaptation based on a prediction of the increase in delay as a function of time, temperature, and usage. The proposed approach involves the use of measurements of variation in the ground, power supply, and I/O signals. These measurements are linked to not only extract model parameters but also estimate the remaining lifetime of ICs accurately.
