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There is now a CONTENT FREEZE for Mercury while we switch to a new platform. It began on Friday, March 10 at 6pm and will end on Wednesday, March 15 at noon. No new content can be created during this time, but all material in the system as of the beginning of the freeze will be migrated to the new platform, including users and groups. Functionally the new site is identical to the old one. webteam@gatech.edu
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ToF-SIMS: WHAT IS STATE-OF-THE-ART
Dr. Nathan Havercroft
ION-TOF USA, Chestnut Ridge, NY
Thursday, March 3, 2016 from 12:00PM to 1:00PM
Marcus Nanotechnology Building | 345 Ferst Drive | Atlanta GA 30332 | Room 1116
In many scientific fields State-of-the-Art is a term used to describe an almost constant change in technology. This is especially true in Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS), where recent advances have opened up many new research opportunities.
Historically, ToF-SIMS has been limited to the surface analysis of solid state, vacuum compatible, materials that were mainly inorganic in nature. The development of cluster ion beams (Bi n+, C60+ and Arn+) has enabled the routine analysis of organic materials in both two and three dimensions. This has led to key breakthroughs in research areas including organic LEDs, organic photovoltaics, polymer materials and biological cells and tissues. Research has even been performed on liquids in vacuum.
This seminar will give a brief introduction to ToF-SIMS, discussing its key benefits in surface science before giving examples of the many research opportunities it can provide.
