Atomic Force Microscopy User Meeting

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There is now a CONTENT FREEZE for Mercury while we switch to a new platform. It began on Friday, March 10 at 6pm and will end on Wednesday, March 15 at noon. No new content can be created during this time, but all material in the system as of the beginning of the freeze will be migrated to the new platform, including users and groups. Functionally the new site is identical to the old one. webteam@gatech.edu
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Event Details
  • Date/Time:
    • Thursday January 28, 2016 - Friday January 29, 2016
      9:30 am - 3:59 pm
  • Location: Marcus Nanotechnology Building | 345 Ferst Drive | Atlanta GA | 30322 | Rm. 1116
  • Phone:
  • URL: http://www.ien.gatech.edu
  • Email: rjeevagan3@mail.gatech.edu
  • Fee(s):
    N/A
  • Extras:
Contact

Rathi Monikandan: rjeevagan3@mail.gatech.edu

Summaries

Summary Sentence: If you are using an AFM from Digital Instruments, Veeco or Bruker, then this pertains to your equipment and could be a valuable meeting.

Full Summary: No summary paragraph submitted.

During this meeting Bruker will have a technical presentation by our Senior Application Scientist, John Thornton, on sample prep, liquid imaging, high aspect ratio imaging & some of the latest electrical advances in AFM.
 
Following John’s presentation we have reserved time through 5PM for questions and discussion about technical issues. We will be ready to discuss your AFM questions:
·       How-to questions
·       Instrument optimization
·       Software manipulation
·       Upgrades, etc.
 
We are providing attendee beverages and snacks and will therefore need an accurate count of attendees.  Please register early and keep us up to date on your attendance.

REGISTER ONLINE: www.bruker.com/BNS-NA_workshops
FIRST 25 TO REGISTER WILL RECEIVE FREE AFM PROBES!

Additional Information

In Campus Calendar
Yes
Groups

NanoTECH, Institute for Electronics and Nanotechnology, Georgia Electronic Design Center (GEDC), The Center for MEMS and Microsystems Technologies, 3D Systems Packaging Research Center

Invited Audience
Undergraduate students, Faculty/Staff, Public, Graduate students
Categories
Career/Professional development, Seminar/Lecture/Colloquium, Training/Workshop
Keywords
atomic force microscopy, high aspect ration imaging, liquid imaging, microscopy, the Institute for Electronics and Nanotechnology, training
Status
  • Created By: Christa Ernst
  • Workflow Status: Published
  • Created On: Jan 26, 2016 - 10:21am
  • Last Updated: Apr 13, 2017 - 5:16pm