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There is now a CONTENT FREEZE for Mercury while we switch to a new platform. It began on Friday, March 10 at 6pm and will end on Wednesday, March 15 at noon. No new content can be created during this time, but all material in the system as of the beginning of the freeze will be migrated to the new platform, including users and groups. Functionally the new site is identical to the old one. webteam@gatech.edu
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Abstract:
As the minimum feature size continues to shrink, a host of vulnerabilities influence the resiliency of VLSI circuits, such as increased process variations as well as workload-dependent runtime variations due to voltage and thermal fluctuations together with device and interconnect aging effects. Current approaches for resilient circuit design consider only a small subset of these factors and typically address each of them in isolation. As a result, over-pessimistic additive design margins resulting from these sources are eroding gains from technology scaling. Moreover the stochastic nature of these variability effects at the nanoscale mandates per-chip runtime monitoring and adaptation. In this talk, I will discuss cross-layer approaches and learning-based data-driven chip health monitoring schemes for resilient system design at nanoscale. I will also touch energy-efficient resilient system design in post-CMOS technologies by discussing design and test of low-power spin-based magnetic memories.
Biography:
Mehdi Tahoori is professor and Chair of Dependable Nano-Computing (CDNC) at Karlsruhe Institute of Technology (KIT) in Germany since 2009. Before that he was an associate professor of ECE at Northeastern University, Boston, USA. He received his Ph.D. and M.S. in Electrical Engineering from Stanford University in 2003 and 2002, respectively, and B.S. in Computer Engineering from Sharif University, Iran, in 2000. He has published more than 200 conference and journal papers on various aspects of emerging technologies for computing and resilient system design. He also holds several US patents. He is on the organizing and technical program committee of various design automation, test, and reliability conferences. He is an associate editor of ACM Journal of Emerging Technologies for Computing. He was the recipient of National Science Foundation CAREER Award. He also received a number of best paper nominations and awards at various conferences.
