RF Back to Basics

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Event Details
  • Date/Time:
    • Tuesday October 22, 2013 - Wednesday October 23, 2013
      8:00 am - 4:59 pm
  • Location: Atlanta, GA
  • Phone: (404) 894-6359
  • URL:
  • Email: LIngle82@gatech.edu
  • Fee(s):
    None
  • Extras:
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Summaries

Summary Sentence: Learn the fundamentals of RF Measurements from experienced Agilent engineers.

Full Summary: Today's engineers working in communications, consumer electronics and aerospace-defense are faced with increasingly complex measurement challenges and rapidly changing technology. A strong foundation in basic measurement techniques is essential for success. This seminar will improve your understanding of basic RF measurements so you can be more efficient and effective, whether you are in R&D or manufacturing test.

  What to expect

Three technical presentations will be given that will cover the following topics: network analysis, signal analysis and signal generation. Attendees will see measurement demonstrations and will have the opportunity to interact with experienced applications engineers. Each attendee will receive a seminar workbook containing slides for all topics.  Who should attend

Recent engineering graduates, experienced R&D engineers transitioning to RF, or technicians and engineers involved in manufacturing test will benefit from this seminar. Attendees should have a good understanding of basic electrical engineering principles.  Technical Presentations

Network Analysis
This presentation addresses the principles of measuring high-frequency electrical networks with network analyzers. Attendees will learn what kind of measurements are made with network analyzers and how they allow characterization of linear and nonlinear device behavior. The session starts with RF fundamentals and takes you through the concepts of reflection, transmission, S-parameters, and X-parameters. The presenters will review the major components of a network analyzer as well as the advantages and limitations of different hardware approaches. The presentation will cover accuracy enhancement and various calibration techniques. Finally, we will conclude with some typical swept-frequency and swept-power measurements commonly performed on filters and amplifiers.

Signal Analysis
Learn why spectrum analysis is important for a variety of applications and how to measure system and device performance using a spectrum analyzer. This presentation begins with an introduction to spectrum analyzers and a discussion of the theory of operation. We will examine the instrument's major components and their significance as well as the spectrum analyzer specifications that are important for your application. Digital modulation concepts and analysis tools will be introduced. Finally, we will briefly discuss some measurement examples like phase noise, and noise figure.

Signal Generation
This presentation addresses the basics of signal generation, key specifications and applications of test signals. We will also show how they can be taken from general purpose to advanced applications such as simulating advanced signal with impairments and interference and how to perform signal capture and waveform correction.  How to enroll

This popular complimentary seminar typically fills to capacity, so early registration is advised.

Register now at Agilent.com

We look forward to your participation in our complimentary seminar!


Regards,

Agilent Technologies

Additional Information

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Georgia Electronic Design Center (GEDC)

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Status
  • Created By: Lindsey Ingle
  • Workflow Status: Draft
  • Created On: Oct 15, 2013 - 9:10am
  • Last Updated: Oct 7, 2016 - 10:05pm