PeelTest73

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PeelTest73

Georgia Tech School of Mechanical Engineering professor Suresh Sitaraman (left) and doctoral student Gregory Ostrowicki examine a specimen scheduled for analysis using the magnetically actuated peel test (MAPT). An enlarged image of the specimen is shown behind them. (Georgia Tech Photo: Gary Meek)

Additional Information

Groups

Research Horizons

Categories
Engineering
Keywords
debonding, delamination, microelectronics, reliability, School of Mechanical Engineering, Suresh Sitaraman
Status
  • Created By: John Toon
  • Workflow Status: Published
  • Created On: Dec 3, 2015 - 4:36pm
  • Last Updated: Oct 7, 2016 - 10:45pm